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JCR Impact Factor: 0.459
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Stefan cel Mare
University of Suceava
Faculty of Electrical Engineering and
Computer Science
13, Universitatii Street
Suceava - 720229
ROMANIA

Print ISSN: 1582-7445
Online ISSN: 1844-7600
WorldCat: 643243560
doi: 10.4316/AECE


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  1/2017 - 16
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A High Optical Transmittance and Low Cost Touch Screen without Patterning

SAMADZAMINI, K., FROUNCHI, J. See more information about  FROUNCHI, J. on SCOPUS See more information about  FROUNCHI, J. on SCOPUS See more information about FROUNCHI, J. on Web of Science, VELADI, H. See more information about VELADI, H. on SCOPUS See more information about VELADI, H. on SCOPUS See more information about VELADI, H. on Web of Science
 
Click to see author's profile on See more information about the author on SCOPUS SCOPUS, See more information about the author on IEEE Xplore IEEE Xplore, See more information about the author on Web of Science Web of Science

Download PDF pdficon (2,069 KB) | Citation | Downloads: 90 | Views: 135

Author keywords
electric potential, electrodes, indium tin oxide, tomography, wiring

References keywords
films(8), oxide(7), thin(6), properties(6), fluorine(5), doped(5), touch(4), optical(4), design(4), chemical(4)
Blue keywords are present in both the references section and the paper title.

About this article
Date of Publication: 2017-02-28
Volume 17, Issue 1, Year 2017, On page(s): 109 - 114
ISSN: 1582-7445, e-ISSN: 1844-7600
Digital Object Identifier: 10.4316/AECE.2017.01016
Web of Science Accession Number: 000396335900016

Abstract
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Transparent Conducting Oxide (TCO) materials such as Fluorine Tin Oxide (FTO) and Indium Tin Oxide (ITO) due to their optical and electrical properties are used in touch screens as electrodes and wires. This paper proposes a novel technique of using Electrical Resistivity Tomography (ERT) method in order to produce touch screens without pattering. Unlike existing techniques, the proposed methodology employs a uniform TCO coated screen with a maximum optical transmittance to convert the touch point coordinates into side electrodes voltages. The performance of the proposed method is tested experimentally on a FTO coated glass with a sheet resistance of 20 ohms/sq. The proposed methodology is found to be less complicated and low cost, since no pattern or electrodes are implemented in the display area.


References | Cited By  «-- Click to see who has cited this paper

[1] M. R. Bhalla, A. V. Bhalla, "Comparative study of various touchscreen technologies," International Journal of Computer Applications, vol. 6, pp. 12-18, 2010.
[CrossRef]


[2] S. M. Hong, Y. F. Tan, H. S. Yeo, B. G. Lee, "1-inch UniTouch System using Kinect," In Signal Processing Image Processing & Pattern Recognition (ICSIPR), pp. 351-355. Feb. 2013.
[CrossRef] [SCOPUS Times Cited 4]


[3] J. Lee, M. T. Cole, J. C. S. Lai, A. Nathan, "An analysis of electrode patterns in capacitive touch screen panels," Journal of Display Technology, vol. 10, pp. 362-366, 2014.
[CrossRef] [Web of Science Times Cited 21] [SCOPUS Times Cited 23]


[4] K. Lim, K. S. Jung, C. S. Jang, J. S. Baek, I. B. Kang, "A fast and energy efficient single-chip touch controller for tablet touch applications," Journal of Display Technology, vol. 9, pp. 520-526, 2013.
[CrossRef] [Web of Science Times Cited 18] [SCOPUS Times Cited 25]


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[CrossRef] [Web of Science Times Cited 1]


[6] M. G. Mohamed, T.-W. Cho, and H. Kim, "Efficient multitouch detection algorithm for large touch screen panels," IEIE Transactions on Smart Processing and Computing, vol. 3, no. 4, pp. 246-250, 2014.
[CrossRef]


[7] A. Stadler, "Transparent conducting oxides—An up-to-date overview," Materials, vol. 5, pp. 661-683, 2012.
[CrossRef] [Web of Science Times Cited 86]


[8] J. Lee, S. Lee, G. Li, M. A. Petruska, D. C. Paine, S. Sun, "A facile solution-phase approach to transparent and conducting ITO nanocrystal assemblies," Journal of the American Chemical Society, vol. 134, pp. 13410-13414, 2012.
[CrossRef] [Web of Science Times Cited 50] [SCOPUS Times Cited 53]


[9] M. Kang, K. InKoo, C. Minwoo, W. K. Sok, "Optical Properties of Sputtered Indium-tin-oxide Thin Films," Journal of the Korean Physical Society, vol. 59, pp. 3280-3283, 2011.
[CrossRef] [Web of Science Times Cited 25]


[10] A. Kumar, C. Zhou, "The race to replace tin-doped indium oxide: which material will win?," ACS nano, vol. 4, pp. 11-14, 2010.
[CrossRef] [Web of Science Times Cited 372] [SCOPUS Times Cited 384]


[11] M. A. Aouaj, R. Diaz, A. Belayachi, F. Rueda, M. Abd-Lefdil, "Comparative study of ITO and FTO thin films grown by spray pyrolysis," Materials Research Bulletin, vol. 44, pp. 1458-1461, 2009.
[CrossRef] [Web of Science Times Cited 65] [SCOPUS Times Cited 70]


[12] V. Bilgin, I. Akyuz, E. Ketenci, S. Kose, F. Atay, "Electrical, structural and surface properties of fluorine doped tin oxide films," Applied Surface Science, vol. 256, pp. 6586-6591, 2010.
[CrossRef] [Web of Science Times Cited 20] [SCOPUS Times Cited 21]


[13] W. Samad, M. S. Muhamad, S. Ashkan, A. Y. Mohd, "Structural, Optical and Electrical Properties of Fluorine Doped Tin Oxide Thin Films Deposited Using Inkjet Printing Technique," Sains Malaysiana, vol. 40, pp. 251-257, 2011.

[14] B. P. Singh, R. Kumar, A. Kumar, J. Gaur, S. P. Singh, R. C. Tyagi, "Effect of annealing on properties of transparent conducting tin oxide films deposited by thermal evaporation," Indian Journal of Pure and Applied Physics, vol. 51, pp. 558-562, 2013.

[15] Z. Y. Banyamin, P. J. Kelly, G. West, J. Boardman, "Electrical and optical properties of fluorine doped tin oxide thin films prepared by magnetron sputtering," Coatings, vol. 4, pp. 732-746, 2014.
[CrossRef] [Web of Science Times Cited 12]


[16] D. W. Sheel, J. M. Gaskell, "Deposition of fluorine doped indium oxide by atmospheric pressure chemical vapour deposition" Thin Solid Films, vol. 520, pp. 1242-1245, 2011.
[CrossRef] [Web of Science Times Cited 11] [SCOPUS Times Cited 11]


[17] P.V. Bhuvaneswari, P. Velusamy, R.R. Babu, S.M. Babu, K. Ramamurthi, M. Arivanandhan, "Effect of fluorine doping on the structural, optical and electrical properties of spray deposited cadmium stannate thin films," Mater. Sci. Semicond. Proc. vol. 16, pp. 1964-1970, 2013.
[CrossRef] [Web of Science Times Cited 7] [SCOPUS Times Cited 7]


[18] M. Sharifi, B. Young, "Electrical resistance tomography (ERT) applications to chemical engineering," Chemical Engineering Research and Design, vol. 91, pp. 1625-1645, 2013.
[CrossRef] [Web of Science Times Cited 18] [SCOPUS Times Cited 28]


[19] L. Orlando, "GPR to constrain ERT data inversion in cavity searching: Theoretical and practical applications in archeology," Journal of Applied Geophysics, vol. 89, pp. 35-47, 2013.
[CrossRef] [Web of Science Times Cited 6] [SCOPUS Times Cited 8]


[20] J. Frounchi, K. Samadzamini, H. Taghipour, "Design and Implementation of an Electrostatic Analyzer on a FPGA for Electrical Resistance Tomography Systems," Proc. 13th Joint International and National CSI Computer (Kish Island), Kish, Iran, 2008.

[21] T. Gunther, C. Rucker, K. Spitzer, "Three-dimensional modeling and inversion of DC resistivity data incorporating-II inversion," Geophysical Journal International, vol. 166, pp. 506-517, July 2006.
[CrossRef] [Web of Science Times Cited 113] [SCOPUS Times Cited 137]


[22] P. Wang, B. Guo, "Multiple Index Optimization Method Based on Orthogonal Design and Fuzzy Analysis for ERT Sensor Design," International Journal of Engineering & Industries, vol. 3, 2012.
[CrossRef]


[23] F. Dong, C. Tan, J. Liu, Y. Xu, H. Wang, "Development of single drive electrode electrical resistance tomography system," IEEE transactions on instrumentation and measurement, vol. 55, pp. 1208-1214, 2006.
[CrossRef] [Web of Science Times Cited 12] [SCOPUS Times Cited 16]




References Weight

Web of Science® Citations for all references: 837 TCR
SCOPUS® Citations for all references: 787 TCR

Web of Science® Average Citations per reference: 35 ACR
SCOPUS® Average Citations per reference: 33 ACR

TCR = Total Citations for References / ACR = Average Citations per Reference

We introduced in 2010 - for the first time in scientific publishing, the term "References Weight", as a quantitative indication of the quality ... Read more

Citations for references updated on 2017-04-21 00:40 in 144 seconds.




Note1: Web of Science® is a registered trademark of Thomson Reuters.
Note2: SCOPUS® is a registered trademark of Elsevier B.V.
Disclaimer: All queries to the respective databases were made by using the DOI record of every reference (where available). Due to technical problems beyond our control, the information is not always accurate. Please use the CrossRef link to visit the respective publisher site.

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Faculty of Electrical Engineering and Computer Science
Stefan cel Mare University of Suceava, Romania


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