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An Evolutionary Approach to the Soft Error Mitigation Technique for Cell-Based DesignPARK, J. K. , KIM, J. T.
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soft error mitigation, single event transient, cell-based design, cell sizing, hybrid genetic algorithm
soft(16), error(13), systems(8), design(8), analysis(8), rate(7), designs(7), circuits(6), logic(5), level(5)
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About this article
Date of Publication: 2015-02-28
Volume 15, Issue 1, Year 2015, On page(s): 33 - 40
ISSN: 1582-7445, e-ISSN: 1844-7600
Digital Object Identifier: 10.4316/AECE.2015.01005
Web of Science Accession Number: 000352158600005
SCOPUS ID: 84924812869
In this paper, we present a soft error mitigation algorithm that searches for the proper gate sizes within constrained gate-level designs. The individual gate sizing has an impact on the former optimization results and degrades the quality of the solution. In order to address this inefficiency, we utilize a modified topological sort that preserves the preceding local optima. Using a new local searcher, a hybrid genetic optimization technique for soft error mitigation is proposed. This evolutionary search algorithm has general genetic operators: the initialization of the population, crossover, mutation and selection operators. The local searcher consists of two subsequent heuristics. These search algorithms make the individual chromosome move to better search regions in a short time and then, the population acquires various candidates for the global optimum with the help of other genetic operators. The experiments show that the proposed genetic algorithm achieves an approximately 90% reduction in the number of soft errors when compared to the conventional greedy approach with at most 30% overhead for the area and critical path delay.
|References|||||Cited By «-- Click to see who has cited this paper|
| J. L. Leray, "Effects of atmospheric neutrons on devices, at sea level and in avionics embedded systems," Microelectronics Reliability, vol.47, pp. 1827-1835, 2007. |
[CrossRef] [Web of Science Times Cited 19] [SCOPUS Times Cited 25]
 R. C. Baumann, "Soft Errors in Commercial Integrated Circuits," Int. J. of High Speed Electronics and Systems. vol. 14, no.2, pp. 299-309, 2004.
[CrossRef] [SCOPUS Times Cited 14]
 E. Normand, "Single Event Effects in Avionics and On The Ground," Int. J. of High Speed Electronics and Systems. vol. 14, no. 2, pp. 285-298, 2004.
[CrossRef] [SCOPUS Times Cited 6]
 P. Shivakumar, M. Kistler, S. W. Keckler, D. Burger and L. Alvisi, "Modeling the Effect of Technology Trends on the Soft Error Rate of Combinational Logic," Proc. of Int. Conf. on Dependable Systems and Networks, pp. 389-398, 2002.
[CrossRef] [Web of Science Times Cited 541] [SCOPUS Times Cited 694]
 M. Zhang and N. R. Shanbhag, "Soft-Error-Rate-Analysis (SERA) Methodology," IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems, vol. 25, no. 10, pp. 2140-2155, 2006.
[CrossRef] [Web of Science Times Cited 51] [SCOPUS Times Cited 76]
 R. R. Rao, K. Chopra, and D. T. Blaauw, "Computing the Soft Error Rate of a Combinational Logic Circuit Using Parameterized Descriptors," IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems, vol. 26, no. 3, pp. 468-479, 2007.
[CrossRef] [Web of Science Times Cited 44] [SCOPUS Times Cited 64]
 J. K. Park, H. S. Choi and J. T. Kim, "A Soft Error Analysis Tool for High-Speed Digital Designs," Proc. of 2nd Int. conf. on Ubiquitous Information Management and Communication, pp. 280-282, 2008.
[CrossRef] [SCOPUS Times Cited 1]
 S. Kwon, J. K. Park and J. T. Kim, "An approximated soft error analysis technique for gate-level designs," IEICE Electronics Express, vol. 11, no. 10, pp. 1-7, 2014.
[CrossRef] [Web of Science Record] [SCOPUS Times Cited 1]
 H-K. Peng, C. H-P. Wen and B. Jayanta, "On soft error rate analysis of scaled CMOS designs: a statistical perspective," Proc. of IEEE/ACM Int’l Conf. on Computer-Aided Design, pp. 157-163, 2009.
 Y-H. Kuo, H-K. Peng and C. H-P. Wen, "Accurate statistical soft error rate (SSER) analysis using a quasi-Monte Carlo framework with quality cell models." Proc. of 11th Int’l symposium on Quality Electronic Design (ISQED), pp. 831-838, 2010.
[CrossRef] [SCOPUS Times Cited 9]
 A. C-C. Chang, R. H-M. Huang and C. H-P. Wen, "CASSER: A Closed-Form Analysis Framework for Statistical Soft Error Rate," IEEE Trans. on Very Large Scale Integration, vol. 21, no. 10, pp. 1837-1848, 2013.
[CrossRef] [Web of Science Times Cited 11] [SCOPUS Times Cited 11]
 N. M. Zivanov and D. Marculescu, "MARS-C: Modeling and Reduction of Soft Errors in Combinational Circuits," Proc. of Design Automation Conference, pp. 767-772, 2006.
 Q. Zhou and K. Mohanram, "Cost-Effective Radiation Hardening Technique for Combinational Logic," Proc. of Int. conf. on Computer Aided Design, pp. 100-106, 2004.
[CrossRef] [Web of Science Times Cited 12]
 H. Asadi and M. Tahoori, "Soft error hardening for logic-level designs," Proc. of IEEE Symp. on In Circuits and Systems, 2006.
 Y. S. Dhillon, A. U. Diril, A. Chatterjee, and A. D. Singh, "Analysis and Optimization of Nanometer CMOS Circuits for Soft-Error Tolerance," IEEE Trans. on Very Large Scale Integration Systems, vol. 14, no. 5, pp. 514-524, 2006.
[CrossRef] [Web of Science Times Cited 43] [SCOPUS Times Cited 58]
 J. K. Park and J. T. Kim, "A soft error mitigation technique for constrained gate-level designs," IEICE Electronics Express, vol. 5, no. 18, pp. 698-704, 2008.
[CrossRef] [Web of Science Times Cited 6] [SCOPUS Times Cited 7]
 J. K. Park and J. T. Kim, "A Cell Sizing Technique for Mitigating Logic Soft Errors in Gate-level Designs," Advances In Electrical and Computer Engineering J., vol. 13, no. 4, pp. 13-18, 2013.
[CrossRef] [Full Text] [Web of Science Times Cited 12] [SCOPUS Times Cited 1]
 M. Gen and R. Cheng, "Genetic Algorithms and Engineering Optimization", pp.1-39, John Wiley & Sons, 2000.
 M. Gen and R. Cheng, "Genetic Algorithms and Engineering Design", pp. 31-33, John Wiley & Sons, 1997.
 J. F. Ziegler, "Terrestrial cosmic rays," IBM J., vol. 40, no. 1, pp. 19-39, 1996.
 P. Hazucha, and C. Svensson, "Impact of CMOS technology scaling on the atmospheric neutron soft error rate," IEEE Trans. on Nuclear Science, vol. 47, no. 6, pp. 2586-2594, 2000.
[CrossRef] [Web of Science Times Cited 252] [SCOPUS Times Cited 327]
 B. Zhang, W. Wang, and M. Orshansky, "FASER: Fast Analysis of Soft Error Susceptibility for Cell-Based Designs," Proc. of 7th Int. Symp. on Quality Electronic Design, pp. 755-760, 2006.
[CrossRef] [SCOPUS Times Cited 79]
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