Click to open the HelpDesk interface
AECE - Front page banner

Menu:


FACTS & FIGURES

JCR Impact Factor: 0.699
JCR 5-Year IF: 0.674
Issues per year: 4
Current issue: May 2018
Next issue: Aug 2018
Avg review time: 104 days


PUBLISHER

Stefan cel Mare
University of Suceava
Faculty of Electrical Engineering and
Computer Science
13, Universitatii Street
Suceava - 720229
ROMANIA

Print ISSN: 1582-7445
Online ISSN: 1844-7600
WorldCat: 643243560
doi: 10.4316/AECE


TRAFFIC STATS

1,991,800 unique visits
539,049 downloads
Since November 1, 2009



Robots online now
Google Web Preview


SJR SCImago RANK

SCImago Journal & Country Rank


SEARCH ENGINES

aece.ro - Google Pagerank




TEXT LINKS

Anycast DNS Hosting
MOST RECENT ISSUES

 Volume 18 (2018)
 
     »   Issue 2 / 2018
 
     »   Issue 1 / 2018
 
 
 Volume 17 (2017)
 
     »   Issue 4 / 2017
 
     »   Issue 3 / 2017
 
     »   Issue 2 / 2017
 
     »   Issue 1 / 2017
 
 
 Volume 16 (2016)
 
     »   Issue 4 / 2016
 
     »   Issue 3 / 2016
 
     »   Issue 2 / 2016
 
     »   Issue 1 / 2016
 
 
 Volume 15 (2015)
 
     »   Issue 4 / 2015
 
     »   Issue 3 / 2015
 
     »   Issue 2 / 2015
 
     »   Issue 1 / 2015
 
 
  View all issues  








LATEST NEWS

2018-Jun-27
Clarivate Analytics published the InCites Journal Citations Report for 2017. The JCR Impact Factor of Advances in Electrical and Computer Engineering is 0.699, and the JCR 5-Year Impact Factor is 0.674.

2017-Jun-14
Thomson Reuters published the Journal Citations Report for 2016. The JCR Impact Factor of Advances in Electrical and Computer Engineering is 0.595, and the JCR 5-Year Impact Factor is 0.661.

2017-Feb-16
With new technologies, such as mobile communications, internet of things, and wide applications of social media, organizations generate a huge volume of data, much faster than several years ago. Big data, characterized by high volume, diversity and velocity, increasingly drives decision making and is changing the landscape of business intelligence, from governments to private organizations, from communities to individuals. Big data analytics that discover insights from evidences has a high demand for computing efficiency, knowledge discovery, problem solving, and event prediction. We dedicate a special section of Issue 4/2017 to Big Data. Prospective authors are asked to make the submissions for this section no later than the 31st of May 2017, placing "BigData - " before the paper title in OpenConf.

Read More »


    
 

  4/2014 - 1
View TOC | « Previous Article | Next Article »

Stochastic Simulation of Integrated Circuits with Nonlinear Black-Box Components via Augmented Deterministic Equivalents

MANFREDI, P. See more information about MANFREDI, P. on SCOPUS See more information about MANFREDI, P. on IEEExplore See more information about MANFREDI, P. on Web of Science, STIEVANO, I. S. See more information about  STIEVANO, I. S. on SCOPUS See more information about  STIEVANO, I. S. on SCOPUS See more information about STIEVANO, I. S. on Web of Science, CANAVERO, F. G. See more information about CANAVERO, F. G. on SCOPUS See more information about CANAVERO, F. G. on SCOPUS See more information about CANAVERO, F. G. on Web of Science
 
Click to see author's profile in See more information about the author on SCOPUS SCOPUS, See more information about the author on IEEE Xplore IEEE Xplore, See more information about the author on Web of Science Web of Science

Download PDF pdficon (1,110 KB) | Citation | Downloads: 834 | Views: 2,084

Author keywords
circuit simulation, integrated circuits, nonlinear circuits, SPICE, statistical analysis

References keywords
stochastic(11), design(8), circuits(8), technology(7), polynomial(7), packaging(6), manufacturing(6), components(6), chaos(6), canavero(6)
Blue keywords are present in both the references section and the paper title.

About this article
Date of Publication: 2014-11-30
Volume 14, Issue 4, Year 2014, On page(s): 3 - 8
ISSN: 1582-7445, e-ISSN: 1844-7600
Digital Object Identifier: 10.4316/AECE.2014.04001
Web of Science Accession Number: 000348772500001
SCOPUS ID: 84921691268

Abstract
Quick view
Full text preview
This paper extends recent literature results concerning the statistical simulation of circuits affected by random electrical parameters by means of the polynomial chaos framework. With respect to previous implementations, based on the generation and simulation of augmented and deterministic circuit equivalents, the modeling is extended to generic and black-box multi-terminal nonlinear subcircuits describing complex devices, like those found in integrated circuits. Moreover, based on recently-published works in this field, a more effective approach to generate the deterministic circuit equivalents is implemented, thus yielding more compact and efficient models for nonlinear components. The approach is fully compatible with commercial (e.g., SPICE-type) circuit simulators and is thoroughly validated through the statistical analysis of a realistic interconnect structure with a 16-bit memory chip. The accuracy and the comparison against previous approaches are also carefully established.


References | Cited By  «-- Click to see who has cited this paper

[1] L. Scheffer, L. Lavagno, and G. Martin, EDA for IC Implementation, Circuit Design, and Process Technology. Boca Raton, FL: CRC Press, Taylor & Francis Group, 2006.

[2] T. Mikazuki and N. Matsui, "Statistical design techniques for high-speed circuit boards with correlated structure distributions," IEEE Transactions on Components, Packaging and Manufacturing Technology, Part A, vol. 17, no. 1, pp. 159-165, 1994,
[CrossRef] [Web of Science Record]


[3] R. Spence and R. S. Soin, Tolerance Design of Electronic Circuits. London: Imperial College Press, 1997.

[4] Q. Zhang, J. J. Liou, J. McMacken, J. Thomson, and P. Layman, "Development of robust interconnect model based on design of experiments and multiobjective optimization," IEEE Transactions on Electron Devices, vol. 48, no. 9, pp. 1885-1891, 2001,
[CrossRef] [SCOPUS Times Cited 44]


[5] A. H. Zaabab, Qi-Jun Zhang, and M. Nakhla, "A neural network modeling approach to circuit optimization and statistical design," IEEE Transactions on Microwave Theory and Techniques, vol. 43, no. 6, pp. 1349-1358, 1995,
[CrossRef] [Web of Science Times Cited 164] [SCOPUS Times Cited 205]


[6] L. Brancik and E. Kolarova, "Simulation of higher-order electrical circuits with stochastic parameters via SDEs," Advances in Electrical and Computer Engineering, vol. 13, no. 1, pp. 17-22, 2013,
[CrossRef] [Full Text] [Web of Science Times Cited 16] [SCOPUS Times Cited 18]


[7] L. Brancik and E. Kolarova, "Application of stochastic differential-algebraic equations in hybrid MTL systems analysis," Elektronika Ir Elektrotechnika, vol. 20, no. 5, pp. 41-45, 2014,
[CrossRef] [Web of Science Times Cited 6] [SCOPUS Times Cited 6]


[8] D. Xiu, "Fast numerical methods for stochastic computations: a review," Communications in Computational Physics, vol. 5, no. 2-4, pp. 242-272, 2009.

[9] Q. Su and K. Strunz, "Stochastic circuit modelling with Hermite polynomial chaos," IET Electronics Letters, vol. 41, no. 21, pp. 1163-1165, 2005,
[CrossRef] [Web of Science Times Cited 17] [SCOPUS Times Cited 21]


[10] K. Strunz and Q. Su, "Stochastic formulation of SPICE-type electronic circuit simulation using polynomial chaos," ACM Transactions on Modeling and Computer Simulation, vol. 18, no. 4, pp. 15:1-15:23, 2008,
[CrossRef] [Web of Science Times Cited 35] [SCOPUS Times Cited 52]


[11] N. Mi, S. X.-D. Tan, Y. Cai, and X. Hong, "Fast variational analysis of on-chip power grids by stochastic extended Krylov subspace method," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 27, no. 11, pp. 1996-2006, 2008,
[CrossRef] [Web of Science Times Cited 17] [SCOPUS Times Cited 18]


[12] S. Vrudhula, J. M. Wang, and P. Ghanta, "Hermite polynomial based interconnect analysis in the presence of process variations," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 25, no. 10, pp. 2001-2011, 2006,
[CrossRef] [Web of Science Times Cited 49] [SCOPUS Times Cited 62]


[13] I. S. Stievano, P. Manfredi, and F. G. Canavero, "Parameters variability effects on multiconductor interconnects via Hermite polynomial chaos," IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 1, no. 8, pp. 1234-1239, 2011,
[CrossRef] [Web of Science Times Cited 64] [SCOPUS Times Cited 73]


[14] D. Vande Ginste, D. De Zutter, D. Deschrijver, T. Dhaene, P. Manfredi, and F. Canavero, "Stochastic modeling-based variability analysis of on-chip interconnects," IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 2, no. 7, pp. 1182-1192, 2012,
[CrossRef] [Web of Science Times Cited 52] [SCOPUS Times Cited 64]


[15] P. Manfredi, D. Vande Ginste, D. De Zutter, and F. G. Canavero, "Uncertainty assessment of lossy and dispersive lines in SPICE-type environments," IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 3, no. 7, pp. 1252-1258, 2013,
[CrossRef] [Web of Science Times Cited 30] [SCOPUS Times Cited 34]


[16] R. G. Ghanem and P. D. Spanos, Stochastic Finite Elements. A Spectral Approach. New York: Springer-Verlag, 1991.

[17] A. Biondi, D. Vande Ginste, D. De Zutter, P. Manfredi, and F. G. Canavero, "Variability analysis of interconnects terminated by general nonlinear loads," IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 3, no. 7, pp. 1244-1251, 2013,
[CrossRef] [Web of Science Times Cited 26] [SCOPUS Times Cited 28]


[18] Z. Zhang, T. A. El-Moselhy, I. M. Elfadel, and L. Daniel, "Stochastic testing method for transistor-level uncertainty quantification based on generalized polynomial chaos," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 32, no. 10, pp. 1533-1545, 2013,
[CrossRef] [Web of Science Times Cited 53] [SCOPUS Times Cited 64]


[19] M. R. Rufuie, E. Gad, M. Nakhla, and R. Achar, "Generalized Hermite polynomial chaos for variability analysis of macromodels embedded in nonlinear circuits," IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 4, no. 4, pp. 673-684, 2014,
[CrossRef] [Web of Science Times Cited 24] [SCOPUS Times Cited 28]


[20] P. Manfredi, D. Vande Ginste, D. De Zutter, and F. G. Canavero, "Stochastic modeling of nonlinear circuits via SPICE-compatible spectral equivalents," IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 61, no. 7, pp. 2057-2065, 2014,
[CrossRef] [Web of Science Times Cited 25] [SCOPUS Times Cited 28]


[21] I. S. Stievano, L. Rigazio, F. G. Canavero, T. R. Cunha, J. C. Pedro, H. M. Teixeira, A. Girardi, R. Izzi, and F. Vitale, "Behavioral modeling of IC memories from measured data," IEEE Transactions on Instrumentation and Measurement, vol. 60, no. 10, pp. 3471-3479, 2011,
[CrossRef] [Web of Science Times Cited 5] [SCOPUS Times Cited 6]


[22] D. Xiu and G. E. Karniadakis, "The Wiener-Askey polynomial chaos for stochastic differential equations," SIAM Journal on Scientific Computing, vol. 24, no. 2, pp. 619-622, 2002,
[CrossRef] [Web of Science Times Cited 1668] [SCOPUS Times Cited 2053]


[23] HSPICE User Guide, Version B-2008.09, Synopsys, Inc., Mountain View, CA, USA, 2008.



References Weight

Web of Science® Citations for all references: 2,251 TCR
SCOPUS® Citations for all references: 2,804 TCR

Web of Science® Average Citations per reference: 94 ACR
SCOPUS® Average Citations per reference: 117 ACR

TCR = Total Citations for References / ACR = Average Citations per Reference

We introduced in 2010 - for the first time in scientific publishing, the term "References Weight", as a quantitative indication of the quality ... Read more

Citations for references updated on 2018-07-15 19:35 in 134 seconds.




Note1: Web of Science® is a registered trademark of Clarivate Analytics.
Note2: SCOPUS® is a registered trademark of Elsevier B.V.
Disclaimer: All queries to the respective databases were made by using the DOI record of every reference (where available). Due to technical problems beyond our control, the information is not always accurate. Please use the CrossRef link to visit the respective publisher site.

Copyright ©2001-2018
Faculty of Electrical Engineering and Computer Science
Stefan cel Mare University of Suceava, Romania


All rights reserved: Advances in Electrical and Computer Engineering is a registered trademark of the Stefan cel Mare University of Suceava. No part of this publication may be reproduced, stored in a retrieval system, photocopied, recorded or archived, without the written permission from the Editor. When authors submit their papers for publication, they agree that the copyright for their article be transferred to the Faculty of Electrical Engineering and Computer Science, Stefan cel Mare University of Suceava, Romania, if and only if the articles are accepted for publication. The copyright covers the exclusive rights to reproduce and distribute the article, including reprints and translations.

Permission for other use: The copyright owner's consent does not extend to copying for general distribution, for promotion, for creating new works, or for resale. Specific written permission must be obtained from the Editor for such copying. Direct linking to files hosted on this website is strictly prohibited.

Disclaimer: Whilst every effort is made by the publishers and editorial board to see that no inaccurate or misleading data, opinions or statements appear in this journal, they wish to make it clear that all information and opinions formulated in the articles, as well as linguistic accuracy, are the sole responsibility of the author.




Website loading speed and performance optimization powered by: