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Stefan cel Mare
University of Suceava
Faculty of Electrical Engineering and
Computer Science
13, Universitatii Street
Suceava - 720229
ROMANIA

Print ISSN: 1582-7445
Online ISSN: 1844-7600
WorldCat: 643243560
doi: 10.4316/AECE


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  4/2014 - 1
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Stochastic Simulation of Integrated Circuits with Nonlinear Black-Box Components via Augmented Deterministic Equivalents

MANFREDI, P. See more information about MANFREDI, P. on SCOPUS See more information about MANFREDI, P. on IEEExplore See more information about MANFREDI, P. on Web of Science, STIEVANO, I. S. See more information about  STIEVANO, I. S. on SCOPUS See more information about  STIEVANO, I. S. on SCOPUS See more information about STIEVANO, I. S. on Web of Science, CANAVERO, F. G. See more information about CANAVERO, F. G. on SCOPUS See more information about CANAVERO, F. G. on SCOPUS See more information about CANAVERO, F. G. on Web of Science
 
Click to see author's profile in See more information about the author on SCOPUS SCOPUS, See more information about the author on IEEE Xplore IEEE Xplore, See more information about the author on Web of Science Web of Science

Download PDF pdficon (1,110 KB) | Citation | Downloads: 907 | Views: 2,542

Author keywords
circuit simulation, integrated circuits, nonlinear circuits, SPICE, statistical analysis

References keywords
stochastic(11), design(8), circuits(8), technology(7), polynomial(7), packaging(6), manufacturing(6), components(6), chaos(6), canavero(6)
Blue keywords are present in both the references section and the paper title.

About this article
Date of Publication: 2014-11-30
Volume 14, Issue 4, Year 2014, On page(s): 3 - 8
ISSN: 1582-7445, e-ISSN: 1844-7600
Digital Object Identifier: 10.4316/AECE.2014.04001
Web of Science Accession Number: 000348772500001
SCOPUS ID: 84921691268

Abstract
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Full text preview
This paper extends recent literature results concerning the statistical simulation of circuits affected by random electrical parameters by means of the polynomial chaos framework. With respect to previous implementations, based on the generation and simulation of augmented and deterministic circuit equivalents, the modeling is extended to generic and black-box multi-terminal nonlinear subcircuits describing complex devices, like those found in integrated circuits. Moreover, based on recently-published works in this field, a more effective approach to generate the deterministic circuit equivalents is implemented, thus yielding more compact and efficient models for nonlinear components. The approach is fully compatible with commercial (e.g., SPICE-type) circuit simulators and is thoroughly validated through the statistical analysis of a realistic interconnect structure with a 16-bit memory chip. The accuracy and the comparison against previous approaches are also carefully established.


References | Cited By  «-- Click to see who has cited this paper

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[15] P. Manfredi, D. Vande Ginste, D. De Zutter, and F. G. Canavero, "Uncertainty assessment of lossy and dispersive lines in SPICE-type environments," IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 3, no. 7, pp. 1252-1258, 2013,
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References Weight

Web of Science® Citations for all references: 2,836 TCR
SCOPUS® Citations for all references: 3,450 TCR

Web of Science® Average Citations per reference: 118 ACR
SCOPUS® Average Citations per reference: 144 ACR

TCR = Total Citations for References / ACR = Average Citations per Reference

We introduced in 2010 - for the first time in scientific publishing, the term "References Weight", as a quantitative indication of the quality ... Read more

Citations for references updated on 2020-01-24 00:21 in 129 seconds.




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