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Issues per year: 4
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Stefan cel Mare
University of Suceava
Faculty of Electrical Engineering and
Computer Science
13, Universitatii Street
Suceava - 720229
ROMANIA

Print ISSN: 1582-7445
Online ISSN: 1844-7600
WorldCat: 643243560
doi: 10.4316/AECE


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Broken Bar Fault Detection in IM Operating Under No-Load Condition, RELJIC, D., JERKAN, D., MARCETIC, D., OROS, D.
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2017-Jun-14
Thomson Reuters published the Journal Citations Report for 2016. The JCR Impact Factor of Advances in Electrical and Computer Engineering is 0.595, and the JCR 5-Year Impact Factor is 0.661.

2017-Apr-04
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2017-Feb-16
With new technologies, such as mobile communications, internet of things, and wide applications of social media, organizations generate a huge volume of data, much faster than several years ago. Big data, characterized by high volume, diversity and velocity, increasingly drives decision making and is changing the landscape of business intelligence, from governments to private organizations, from communities to individuals. Big data analytics that discover insights from evidences has a high demand for computing efficiency, knowledge discovery, problem solving, and event prediction. We dedicate a special section of Issue 4/2017 to Big Data. Prospective authors are asked to make the submissions for this section no later than the 31st of May 2017, placing "BigData - " before the paper title in OpenConf.

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2016-Dec-17
IoT is a new emerging technology domain which will be used to connect all objects through the Internet for remote sensing and control. IoT uses a combination of WSN (Wireless Sensor Network), M2M (Machine to Machine), robotics, wireless networking, Internet technologies, and Smart Devices. We dedicate a special section of Issue 2/2017 to IoT. Prospective authors are asked to make the submissions for this section no later than the 31st of March 2017, placing "IoT - " before the paper title in OpenConf.

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  2/2012 - 12

Automated Testing System for a CAN Communication Circuit

PRUTIANU, F. See more information about PRUTIANU, F. on SCOPUS See more information about PRUTIANU, F. on IEEExplore See more information about PRUTIANU, F. on Web of Science, POPESCU, V. See more information about  POPESCU, V. on SCOPUS See more information about  POPESCU, V. on SCOPUS See more information about POPESCU, V. on Web of Science, LASCU, D. See more information about LASCU, D. on SCOPUS See more information about LASCU, D. on SCOPUS See more information about LASCU, D. on Web of Science
 
Click to see author's profile on See more information about the author on SCOPUS SCOPUS, See more information about the author on IEEE Xplore IEEE Xplore, See more information about the author on Web of Science Web of Science

Download PDF pdficon (1,043 KB) | Citation | Downloads: 508 | Views: 2,248

Author keywords
automated measuring/validation/testing system, LabVIEW programming, testing algorithm, remote control

References keywords
automated(14), system(12), testing(9), test(8), systems(7), control(6), software(5), measurement(5), labview(5), icemi(4)
Blue keywords are present in both the references section and the paper title.

About this article
Date of Publication: 2012-05-30
Volume 12, Issue 2, Year 2012, On page(s): 69 - 74
ISSN: 1582-7445, e-ISSN: 1844-7600
Digital Object Identifier: 10.4316/AECE.2012.02012
Web of Science Accession Number: 000305608000012
SCOPUS ID: 84923821847

Abstract
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Full text preview
The paper presents a method for validation/testing a control area network (CAN) communication circuit used in all electronic control units (ECUs) developed in automotive industry after 2000. Using a specific hardware configuration and remotely controlled by LabVIEW. The author's presents their own vision regarding operational software algorithm implementation and integration / execution of some test cases in order to validate a CAN circuit. Using this method, it is possible to validate/test CAN hardware circuits in a short time and with the possibility of saving the test results. Human operator is interfering with the system only through the graphical user interface. The error sources for this system are reduced to minimum.


References | Cited By  «-- Click to see who has cited this paper

[1] Goad K.G., Tront J.G, McKeeman J.C, "A PC-based automated guided probe testing system", System Theory 1989 Proceedings, Twenty-First Southeastern Symposium on, pp. 345-348, March 1989

[2] Hawrylak P.J., Ogirala A., Cain J.T., Mickle M.H, "Automated Test System for ISO 18000-7 Active RFID", RFID, 2008 IEEE International conference, pp 9-18, April 2008
[CrossRef] [Web of Science Record] [SCOPUS Times Cited 5]


[3] Zhang Wenfan, Liao Hui, "Design and research of performance of automated test system of electro-hydraulic proportional valve", International Conference on Eletronics, Communication and Control (ICECC) 2011, pp 1989-1991, Septmeber 2011
[CrossRef] [SCOPUS Times Cited 4]


[4] Jianguang Jia, Jingming Kuang, Zunwen He, Jun Fang, "Design of automated test system based on GPIB", ICEMI '09th International Conference on Electronic Measurement & Instruments 2009, pp 1-943 - 1-948, August 2009
[CrossRef] [SCOPUS Record]


[5] Celanovic N.L, Celanovic I.L, Ivanovic Z.R., "Cyber Physical System: A mew approach to power electronics Simulation, Control and Testing", vol.12, pp.33-38, February 2012

[6] Ono K.,Ohmori K.,Fujii T., Asakura T., "Automated testing system for switching systems with multiple modules", International IEEE Conference on Communications, 1997 ICC Montreal Towards the Knowledge Millennium, pp. 236-240, Jun. 1997
[CrossRef]


[7] Hongbo Yu, Yihua Lan, Haozheng Ren, "The Research about an Automated Software Testing System Run Tool", 2011 3rd International Workshop on Intelligent Systems and Applications USA, pp. 1-4, May 2011

[8] Czapski J., "Useful features of automated test systems in the R&D laboratory", 2000 IEEE Autotestcon Proceedings, pp 601-613, Sep. 2000
[CrossRef] [Web of Science Times Cited 2]


[9] Novak J., "Flexible approach to the Controller Area Networks test and evaluation", 2009 IDAACS IEEE International Workshop on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications, pp. 44-48, Sept.2009
[CrossRef] [Web of Science Times Cited 1] [SCOPUS Times Cited 2]


[10] Novak J., Kocourek P., "Automated Testing of Electronic Control Units Compatibility in Vehicle CAN Networks", 2005 Proceedings of the IEEE International Symposium on Industrial Electronics, pp.1423-1428, June 2005.
[CrossRef] [SCOPUS Times Cited 8]


[11] Lindlar F., Windisch A., "A Search Based Approach to Functional Hardware in the Loop Testing", 2010 Second International Symposium on Search Based Software Engineering (SSBSE), pp.111-119, Sept.2010
[CrossRef] [SCOPUS Times Cited 7]


[12] Bruno L., Andre M.,"A Comparison between LAN and GPIB Instrument Interfaces in a Automated Test System", 2007 ICEMI 8th International Conference on Electronic measurement and Instruments, pp. I 761- I 762, Aug.2007
[CrossRef] [SCOPUS Times Cited 5]


[13] Zulkifli M.Z, Harun S.W, Thambiratnam, Ahmad H., "Self Calibrating Automated Characterization Systems for Depressed Cladding EDFA Applications Using LabVIEW Software with GPIB", IEEE transactions on Instrumentation and Measurement, pp. 2677-2681, Nov. 2008
[CrossRef] [Web of Science Times Cited 2] [SCOPUS Times Cited 9]


[14] Goulart T.J, Consonni D, "Automated system for measuring electrical three-phase power components", IEEE Transaction on Education, pp. 336-341, Nov. 2001
[CrossRef] [Web of Science Times Cited 5] [SCOPUS Times Cited 7]


[15] Jan G.J., Law S.F., "Implementation and use of general purpose interface bus interface in an automatic testing and measurement system of a management power supply", Review of Scientific Instruments, pp. 2488-2493, Nov. 1988
[CrossRef] [Web of Science Record] [SCOPUS Times Cited 2]


[16] Neskovic M.D, Spasic J.S, Celebic V.V, Salom I.M (2010) "An Automated hardware testing using PXI hardware and LabVIEW software", 2010 5th European Conference on Circuits and systems for communication (ECCSC), pp 232-235, 2010

[17] Leikai Ma, Liang Xu, Kunpeng Zhang, Wei Wu, "The measurement of series and shung resistance of the silicon solar cell based on LabVIEW", 2011 International Conference on Electrical and Control Engineering (ICECE), pp. 2711-2714, Sept. 2011
[CrossRef] [SCOPUS Times Cited 3]


[18] Swain N.K., Anderson J.A, Ajit Singh, Swain M., Fulton M., Garrett J., Tucker O.,"Remote data acquisition, control and analysis using LabVIEW fron panel and real time engine", IEEE Procedings 2003 SoutheastCon 2003, pp. 1-6, April 2003
[CrossRef] [Web of Science Times Cited 16]


[19] Li Pengfei, Nie Luhua, "Remote Control Laboratory Based on LabVIEW", ICICTA '09 Second International Conference on Intelligent Computation Technology and Automation, pp. 84-87, Oct. 2009
[CrossRef] [Web of Science Times Cited 3] [SCOPUS Times Cited 14]


[20] Zhang Xinjun, Tashiro Y., Takata H., Fujii T., Yamamuro M., Kasai D., Shimomura T., "An approach to automated program testing and debugging", 1999 Proceedings Sixth Asia Pacific in Software Engineering Conference, pp. 582-589, Dec. 1999
[CrossRef]


[21] www. Agilent.com, "Test system Development Guide"

[22] www.agilent.com, "Agilent Connectivity Hardware for PC-to-Instrument Connections"

[23] www.ni.com, "Designing Automated Test Systems"

[24] International Standard, Road Vehicles - Controller Area Network Part II: High-speed access unit, ISOCD 11898-2

[25] Internationl Standard, Road vehicles - Controller Area Network Part V, ISO11898-5

[26] D. Skvorc, I. Zuzak, S. Srbljic, "Formal Model for Data Dependency Analysis between Controls and Actions of a Graphical User Interface," Advances in Electrical and Computer Engineering, vol. 12, no. 1, pp. 63-70, 2012
[CrossRef] [Full Text] [Web of Science Times Cited 2] [SCOPUS Times Cited 3]






References Weight

Web of Science® Citations for all references: 31 TCR
SCOPUS® Citations for all references: 69 TCR

Web of Science® Average Citations per reference: 1 ACR
SCOPUS® Average Citations per reference: 2 ACR

TCR = Total Citations for References / ACR = Average Citations per Reference

We introduced in 2010 - for the first time in scientific publishing, the term "References Weight", as a quantitative indication of the quality ... Read more

Citations for references updated on 2017-08-18 22:15 in 111 seconds.




Note1: Web of Science® is a registered trademark of Thomson Reuters.
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Disclaimer: All queries to the respective databases were made by using the DOI record of every reference (where available). Due to technical problems beyond our control, the information is not always accurate. Please use the CrossRef link to visit the respective publisher site.

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Faculty of Electrical Engineering and Computer Science
Stefan cel Mare University of Suceava, Romania


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