|2/2008 - 9|
Static Test Compaction for VLSI Tests An Evolutionary ApproachLOGOFATU, D.
|Click to see author's profile in SCOPUS, IEEE Xplore, Web of Science|
|Download PDF (929 KB) | Citation | Downloads: 803 | Views: 3,844|
evolutionary algorithms, digital circuit design, test compaction problem, set coverage problem, test generation, greedy algorithm, optimization, don't care value
algorithms(11), drechsler(6), test(5), logofatu(5), genetic(5), vlsi(4), systems(4), problems(4), design(4), data(4)
Blue keywords are present in both the references section and the paper title.
About this article
Date of Publication: 2008-06-02
Volume 8, Issue 2, Year 2008, On page(s): 49 - 53
ISSN: 1582-7445, e-ISSN: 1844-7600
Digital Object Identifier: 10.4316/AECE.2008.02009
Web of Science Accession Number: 000264815000009
SCOPUS ID: 77955593111
The test compaction is one of most important requirement regarding the large scale integration (LSI) testing. The overall cost of a VLSI circuit's testing depends on the length of its test sequence; therefore the reduction of this sequence, keeping the coverage of error prone points, will lead to a reduction of used resources in the testing process. This problem is NP-complete. Consequently an optimal algorithm doesn't have applicability in practice. In this paper we describe an evolutionary algorithm (GATC) and we introduce the term of compaction factor (cf), i.e. the expected percentage of compacted test sequence. GATC provides in praxis better results than a greedy approach (GR) for many configurations. This improvement comes from the freedom to merge randomly pairs of compatible tests for different candidates to solution and keeps the ones with more Don't care positions, thus there is an increased probability to find for them compatible tests in the next stage. Also the C++ implementation was optimized, using compact data structures and the Standard Template Library.
|References|||||Cited By «-- Click to see who has cited this paper|
| Alon, N., Moshkovitz, D., Safra, M., "Algorithmic construction of sets for k-restrictions," ACM Transactions on Algorithms (TALG), v. 2 n.2, pp. 153-177, 2006. |
[CrossRef] [Web of Science Times Cited 149] [SCOPUS Times Cited 191]
 Cardei, M., Wu, J., "Energy-efficient coverage problems in wireless ad-hoc sensor networks," Computer Communications, v. 29 n. 4, pp. 415-420, 2006.
[CrossRef] [Web of Science Times Cited 337] [SCOPUS Times Cited 462]
 Cormen, T. H., Leiserson, C. E., Rivest, R. L., Stein, C., "Introduction to Algorithms", 2nd Edition, MIT Press, 2001.
 Davis, L., "Applying adaptive algorithms to epistatic domains," In Proceedings of IJCAI, pages 162-164, 1985.
 Davis, L., "Handbook of Genetic Algorithms", New York, 1991.
 De Micheli, G., "Synthesis and Optimization of Digital Circuits", McGraw-Hill, Inc., 1994.
 Drechsler, N., Drechsler, R., "Exploiting dont cares during data sequencing using genetic algorithms", In ASP Design Automation Conf., pp. 303-306, 1999.
 Drechsler, R., Drechsler, N., "Evolutionary Algorithms for Embedded System Design", Kluwer Acadmeic Publisher, 2002.
 Drechsler, R., "Evolutionary Algorithms for VLSI CAD", Kluwer Academic Publisher, 1998.
 El-Maleh, A., Osais, Y., "Test vector decomposition based static compaction algorithms for combinatorial circuits", ACM Trans. Des. Autom. Electron. Syst., vol. 8, pp. 430-459, 2003.
[CrossRef] [Web of Science Times Cited 38] [SCOPUS Times Cited 45]
 Feige, U., "A Thereshold of lnn for Approximating Set Cover", Journal of the ACM (JACM), v. 45 n. 4, pp. 634-652, 1998.
[CrossRef] [Web of Science Times Cited 1381] [SCOPUS Times Cited 1761]
 Garey, M. R., Johnson, D. S., "Computers and Intractability - A Guide to NP-Completeness", Freeman, San Francisco, 1979.
 Guo, R., Pomeranz, I., Reddy, S. M., "On improving static test compaction for sequential circuits", VLSI Design, Fourteenth International Conference, pp. 111-116, 2001.
 Higami, Y., Kajihara, S., Pomeranz, I., Kobayashi, S., Takamatsu, Y., "On Finding Dont Cares in Test Sequences for Sequential Circuits", IEICE Transactions on Information and Systems, v. E89 n. 11, 2006.
[CrossRef] [Web of Science Times Cited 3]
 Hochbaum, D., S., Pathria, A., "Analysis of the greedy approach in problems of maximum k-coverage", Naval Research Logistics, v. 45 n.6, pp. 615-627, 1998.
[CrossRef] [SCOPUS Times Cited 113]
 Holland, J. H., "Adaption in Natural and Artificial Systems", The University of Michigan Press, Ann Arbor, MI, 1975.
 Ibrahim, W., El-Chouemi, A., El-Sayed, H., "Novel Heuristic and Genetic Algorithms for the VLSI Test Coverage Problem", Computer Systems and Applications, IEEE International Conference, pp. 402-408, 2006.
 Karp, M. R., "Reductibility Among Combinatorial Problems", Complexity of Computer Computations (Symposium Proceedings), Plenum Press, 1972.
 Logofatu, D., "Algorithmen und Problemlösungen mit C++", Vieweg-Verlag, 2006.
 Logofatu, D., "Drechsler, R., Efficient Evolutionary Approaches for the Data Ordering Problem with Inversion", 3rd European Workshop on Hardware Optimisation Techniques (EvoHOT), LNCS 3907, pp. 320-331, Budapest, 2006.
 Logofatu, D., "Greedy Approaches for the Data Ordering Problem with Inversion", Proceedings of ROSYCS, Romanian Symposium on Computer Science, pp. 65-80, Iasi, 2006.
 Logofatu, D., "Algoritmi fundamentali in C++. Aplicaþii", Editura Polirom, Iasi, 2007.
 Logofatu, D., "Algoritmi fundamentali in Java. Aplicaþii", Editura Polirom, Iasi, 2007.
 Lund, C., Yannakakis, M., "On the hardness of approximating minimization problems", Journal of the ACM (JACM), v. 41 n. 5, pp. 960-981, 1994.
[CrossRef] [Web of Science Times Cited 429] [SCOPUS Times Cited 534]
 Mazumder, P., Rudnick, E., "Genetic Algorithms for VLSI Design, Layout & Test Automation", Prentice Hall, 1998.
 Michalewicz, Z., "Genetic Algorithms + Data Structures = Evolution Program", 3rd ed. Springer-Verlag, Berlin Heidelberg New York (1996).
 Murray, A., T., Kim, K., K., Davis, J., W., Machiraju, R., Parent, R., "Coverage optimization to support security monitoring, Computers, Environment and Urban Systems", vol. 31, n. 2, pp 133-147, 2007.
[CrossRef] [Web of Science Times Cited 87] [SCOPUS Times Cited 116]
Web of Science® Citations for all references: 2,424 TCR
SCOPUS® Citations for all references: 3,222 TCR
Web of Science® Average Citations per reference: 90 ACR
SCOPUS® Average Citations per reference: 119 ACR
TCR = Total Citations for References / ACR = Average Citations per Reference
We introduced in 2010 - for the first time in scientific publishing, the term "References Weight", as a quantitative indication of the quality ... Read more
Citations for references updated on 2020-11-17 10:11 in 67 seconds.
Note1: Web of Science® is a registered trademark of Clarivate Analytics.
Note2: SCOPUS® is a registered trademark of Elsevier B.V.
Disclaimer: All queries to the respective databases were made by using the DOI record of every reference (where available). Due to technical problems beyond our control, the information is not always accurate. Please use the CrossRef link to visit the respective publisher site.
Faculty of Electrical Engineering and Computer Science
Stefan cel Mare University of Suceava, Romania
All rights reserved: Advances in Electrical and Computer Engineering is a registered trademark of the Stefan cel Mare University of Suceava. No part of this publication may be reproduced, stored in a retrieval system, photocopied, recorded or archived, without the written permission from the Editor. When authors submit their papers for publication, they agree that the copyright for their article be transferred to the Faculty of Electrical Engineering and Computer Science, Stefan cel Mare University of Suceava, Romania, if and only if the articles are accepted for publication. The copyright covers the exclusive rights to reproduce and distribute the article, including reprints and translations.
Permission for other use: The copyright owner's consent does not extend to copying for general distribution, for promotion, for creating new works, or for resale. Specific written permission must be obtained from the Editor for such copying. Direct linking to files hosted on this website is strictly prohibited.
Disclaimer: Whilst every effort is made by the publishers and editorial board to see that no inaccurate or misleading data, opinions or statements appear in this journal, they wish to make it clear that all information and opinions formulated in the articles, as well as linguistic accuracy, are the sole responsibility of the author.