| 4/2014 - 1 | View TOC | « Previous Article | Next Article » |
Stochastic Simulation of Integrated Circuits with Nonlinear Black-Box Components via Augmented Deterministic EquivalentsMANFREDI, P.   , STIEVANO, I. S. , CANAVERO, F. G. |
View the paper record and citations in  |
| Click to see author's profile in SCOPUS, IEEE Xplore, Web of Science |
Download PDF  (1,110 KB) | Citation | Downloads: 1,430 | Views: 3,625 |
Author keywords
circuit simulation, integrated circuits, nonlinear circuits, SPICE, statistical analysis
References keywords
stochastic(11), design(8), circuits(8), technology(7), polynomial(7), packaging(6), manufacturing(6), components(6), chaos(6), canavero(6)
Blue keywords are present in both the references section and the paper title.
About this article
Date of Publication: 2014-11-30
Volume 14, Issue 4, Year 2014, On page(s): 3 - 8
ISSN: 1582-7445, e-ISSN: 1844-7600
Digital Object Identifier: 10.4316/AECE.2014.04001
Web of Science Accession Number: 000348772500001
SCOPUS ID: 84921691268
Abstract
This paper extends recent literature results concerning the statistical simulation of circuits affected by random electrical parameters by means of the polynomial chaos framework. With respect to previous implementations, based on the generation and simulation of augmented and deterministic circuit equivalents, the modeling is extended to generic and black-box multi-terminal nonlinear subcircuits describing complex devices, like those found in integrated circuits. Moreover, based on recently-published works in this field, a more effective approach to generate the deterministic circuit equivalents is implemented, thus yielding more compact and efficient models for nonlinear components. The approach is fully compatible with commercial (e.g., SPICE-type) circuit simulators and is thoroughly validated through the statistical analysis of a realistic interconnect structure with a 16-bit memory chip. The accuracy and the comparison against previous approaches are also carefully established. |
| References | | | Cited By «-- Click to see who has cited this paper |
| [1] L. Scheffer, L. Lavagno, and G. Martin, EDA for IC Implementation, Circuit Design, and Process Technology. Boca Raton, FL: CRC Press, Taylor & Francis Group, 2006.
[2] T. Mikazuki and N. Matsui, "Statistical design techniques for high-speed circuit boards with correlated structure distributions," IEEE Transactions on Components, Packaging and Manufacturing Technology, Part A, vol. 17, no. 1, pp. 159-165, 1994, [CrossRef] [Web of Science Record] [3] R. Spence and R. S. Soin, Tolerance Design of Electronic Circuits. London: Imperial College Press, 1997. [4] Q. Zhang, J. J. Liou, J. McMacken, J. Thomson, and P. Layman, "Development of robust interconnect model based on design of experiments and multiobjective optimization," IEEE Transactions on Electron Devices, vol. 48, no. 9, pp. 1885-1891, 2001, [CrossRef] [SCOPUS Times Cited 53] [5] A. H. Zaabab, Qi-Jun Zhang, and M. Nakhla, "A neural network modeling approach to circuit optimization and statistical design," IEEE Transactions on Microwave Theory and Techniques, vol. 43, no. 6, pp. 1349-1358, 1995, [CrossRef] [Web of Science Times Cited 193] [SCOPUS Times Cited 245] [6] L. Brancik and E. Kolarova, "Simulation of higher-order electrical circuits with stochastic parameters via SDEs," Advances in Electrical and Computer Engineering, vol. 13, no. 1, pp. 17-22, 2013, [CrossRef] [Full Text] [Web of Science Times Cited 19] [SCOPUS Times Cited 22] [7] L. Brancik and E. Kolarova, "Application of stochastic differential-algebraic equations in hybrid MTL systems analysis," Elektronika Ir Elektrotechnika, vol. 20, no. 5, pp. 41-45, 2014, [CrossRef] [Web of Science Times Cited 13] [8] D. Xiu, "Fast numerical methods for stochastic computations: a review," Communications in Computational Physics, vol. 5, no. 2-4, pp. 242-272, 2009. [9] Q. Su and K. Strunz, "Stochastic circuit modelling with Hermite polynomial chaos," IET Electronics Letters, vol. 41, no. 21, pp. 1163-1165, 2005, [CrossRef] [Web of Science Times Cited 24] [SCOPUS Times Cited 30] [10] K. Strunz and Q. Su, "Stochastic formulation of SPICE-type electronic circuit simulation using polynomial chaos," ACM Transactions on Modeling and Computer Simulation, vol. 18, no. 4, pp. 15:1-15:23, 2008, [CrossRef] [Web of Science Times Cited 61] [SCOPUS Times Cited 68] [11] N. Mi, S. X.-D. Tan, Y. Cai, and X. Hong, "Fast variational analysis of on-chip power grids by stochastic extended Krylov subspace method," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 27, no. 11, pp. 1996-2006, 2008, [CrossRef] [Web of Science Times Cited 20] [SCOPUS Times Cited 22] [12] S. Vrudhula, J. M. Wang, and P. Ghanta, "Hermite polynomial based interconnect analysis in the presence of process variations," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 25, no. 10, pp. 2001-2011, 2006, [CrossRef] [Web of Science Times Cited 62] [SCOPUS Times Cited 77] [13] I. S. Stievano, P. Manfredi, and F. G. Canavero, "Parameters variability effects on multiconductor interconnects via Hermite polynomial chaos," IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 1, no. 8, pp. 1234-1239, 2011, [CrossRef] [Web of Science Times Cited 81] [SCOPUS Times Cited 92] [14] D. Vande Ginste, D. De Zutter, D. Deschrijver, T. Dhaene, P. Manfredi, and F. Canavero, "Stochastic modeling-based variability analysis of on-chip interconnects," IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 2, no. 7, pp. 1182-1192, 2012, [CrossRef] [Web of Science Times Cited 80] [SCOPUS Times Cited 91] [15] P. Manfredi, D. Vande Ginste, D. De Zutter, and F. G. Canavero, "Uncertainty assessment of lossy and dispersive lines in SPICE-type environments," IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 3, no. 7, pp. 1252-1258, 2013, [CrossRef] [Web of Science Times Cited 47] [SCOPUS Times Cited 51] [16] R. G. Ghanem and P. D. Spanos, Stochastic Finite Elements. A Spectral Approach. New York: Springer-Verlag, 1991. [17] A. Biondi, D. Vande Ginste, D. De Zutter, P. Manfredi, and F. G. Canavero, "Variability analysis of interconnects terminated by general nonlinear loads," IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 3, no. 7, pp. 1244-1251, 2013, [CrossRef] [Web of Science Times Cited 34] [SCOPUS Times Cited 40] [18] Z. Zhang, T. A. El-Moselhy, I. M. Elfadel, and L. Daniel, "Stochastic testing method for transistor-level uncertainty quantification based on generalized polynomial chaos," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 32, no. 10, pp. 1533-1545, 2013, [CrossRef] [Web of Science Times Cited 140] [SCOPUS Times Cited 157] [19] M. R. Rufuie, E. Gad, M. Nakhla, and R. Achar, "Generalized Hermite polynomial chaos for variability analysis of macromodels embedded in nonlinear circuits," IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 4, no. 4, pp. 673-684, 2014, [CrossRef] [Web of Science Times Cited 55] [SCOPUS Times Cited 64] [20] P. Manfredi, D. Vande Ginste, D. De Zutter, and F. G. Canavero, "Stochastic modeling of nonlinear circuits via SPICE-compatible spectral equivalents," IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 61, no. 7, pp. 2057-2065, 2014, [CrossRef] [Web of Science Times Cited 47] [SCOPUS Times Cited 53] [21] I. S. Stievano, L. Rigazio, F. G. Canavero, T. R. Cunha, J. C. Pedro, H. M. Teixeira, A. Girardi, R. Izzi, and F. Vitale, "Behavioral modeling of IC memories from measured data," IEEE Transactions on Instrumentation and Measurement, vol. 60, no. 10, pp. 3471-3479, 2011, [CrossRef] [Web of Science Times Cited 7] [SCOPUS Times Cited 9] [22] D. Xiu and G. E. Karniadakis, "The Wiener-Askey polynomial chaos for stochastic differential equations," SIAM Journal on Scientific Computing, vol. 24, no. 2, pp. 619-622, 2002, [CrossRef] [Web of Science Times Cited 3329] [SCOPUS Times Cited 3934] [23] HSPICE User Guide, Version B-2008.09, Synopsys, Inc., Mountain View, CA, USA, 2008. Web of Science® Citations for all references: 4,212 TCR SCOPUS® Citations for all references: 5,008 TCR Web of Science® Average Citations per reference: 176 ACR SCOPUS® Average Citations per reference: 209 ACR TCR = Total Citations for References / ACR = Average Citations per Reference We introduced in 2010 - for the first time in scientific publishing, the term "References Weight", as a quantitative indication of the quality ... Read more Citations for references updated on 2024-04-17 19:07 in 115 seconds. Note1: Web of Science® is a registered trademark of Clarivate Analytics. Note2: SCOPUS® is a registered trademark of Elsevier B.V. Disclaimer: All queries to the respective databases were made by using the DOI record of every reference (where available). Due to technical problems beyond our control, the information is not always accurate. Please use the CrossRef link to visit the respective publisher site. |
Copyright ©2001-2024
Faculty of Electrical Engineering and Computer Science
Stefan cel Mare University of Suceava, Romania
All rights reserved: Advances in Electrical and Computer Engineering is a registered trademark of the Stefan cel Mare University of Suceava. No part of this publication may be reproduced, stored in a retrieval system, photocopied, recorded or archived, without the written permission from the Editor. When authors submit their papers for publication, they agree that the copyright for their article be transferred to the Faculty of Electrical Engineering and Computer Science, Stefan cel Mare University of Suceava, Romania, if and only if the articles are accepted for publication. The copyright covers the exclusive rights to reproduce and distribute the article, including reprints and translations.
Permission for other use: The copyright owner's consent does not extend to copying for general distribution, for promotion, for creating new works, or for resale. Specific written permission must be obtained from the Editor for such copying. Direct linking to files hosted on this website is strictly prohibited.
Disclaimer: Whilst every effort is made by the publishers and editorial board to see that no inaccurate or misleading data, opinions or statements appear in this journal, they wish to make it clear that all information and opinions formulated in the articles, as well as linguistic accuracy, are the sole responsibility of the author.
Faculty of Electrical Engineering and Computer Science
Stefan cel Mare University of Suceava, Romania
All rights reserved: Advances in Electrical and Computer Engineering is a registered trademark of the Stefan cel Mare University of Suceava. No part of this publication may be reproduced, stored in a retrieval system, photocopied, recorded or archived, without the written permission from the Editor. When authors submit their papers for publication, they agree that the copyright for their article be transferred to the Faculty of Electrical Engineering and Computer Science, Stefan cel Mare University of Suceava, Romania, if and only if the articles are accepted for publication. The copyright covers the exclusive rights to reproduce and distribute the article, including reprints and translations.
Permission for other use: The copyright owner's consent does not extend to copying for general distribution, for promotion, for creating new works, or for resale. Specific written permission must be obtained from the Editor for such copying. Direct linking to files hosted on this website is strictly prohibited.
Disclaimer: Whilst every effort is made by the publishers and editorial board to see that no inaccurate or misleading data, opinions or statements appear in this journal, they wish to make it clear that all information and opinions formulated in the articles, as well as linguistic accuracy, are the sole responsibility of the author.
