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Immunity Characterization of FPGA I/Os for Fault-Tolerant Circuit Designs against EMINGUYEN, V. T. , DAM, M. T. , SO, J., LEE, J.-G.
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immunity, susceptibility, integrated circuit, electromagnetic compatibility, electromagnetic interference
circuits(10), integrated(9), power(8), immunity(7), electromagnetic(7), temc(6), susceptibility(6), electro(6), compat(6), modeling(4)
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About this article
Date of Publication: 2019-05-31
Volume 19, Issue 2, Year 2019, On page(s): 37 - 44
ISSN: 1582-7445, e-ISSN: 1844-7600
Digital Object Identifier: 10.4316/AECE.2019.02005
Web of Science Accession Number: 000475806300005
SCOPUS ID: 85066298408
This paper characterizes the immunity of I/Os under different supply voltages for fault-tolerant circuit designs against electromagnetic interference. The direct power injection approach is used as a means to characterize the immunity of circuits. In this work, the immunity characterization has been performed under two scenarios: (1) an input buffer of a Field Programmable Gate Array (FPGA) followed by a single flip-flop, and (2) the FPGA input buffer followed by a redundancy-based fault-tolerant circuit. The experimental results show that when downscaling the supply voltage through a set of nominal values (i.e., 3.3, 2.5, 1.8, 1.5, 1.2 V), the immunity of I/Os is decreased from the highest level at 3.3 V to the lowest at 1.2 V. Particularly, the maximum difference in the immunity is about 16.8 dB at the frequency of 600 MHz. Moreover, experiments demonstrate that I/O buffers followed by the redundancy-based fault-tolerant circuit can improve the immunity of the circuit up to 4 dB below the frequency band of 400 MHz. Thus, the redundancy-based fault-tolerant circuit can support I/Os to operate reliably in the harsh environment.
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