Click to open the HelpDesk interface
AECE - Front page banner

Menu:


FACTS & FIGURES

JCR Impact Factor: 0.650
JCR 5-Year IF: 0.639
Issues per year: 4
Current issue: May 2019
Next issue: Aug 2019
Avg review time: 81 days


PUBLISHER

Stefan cel Mare
University of Suceava
Faculty of Electrical Engineering and
Computer Science
13, Universitatii Street
Suceava - 720229
ROMANIA

Print ISSN: 1582-7445
Online ISSN: 1844-7600
WorldCat: 643243560
doi: 10.4316/AECE


TRAFFIC STATS

2,303,365 unique visits
600,690 downloads
Since November 1, 2009



No robots online now


SJR SCImago RANK

SCImago Journal & Country Rank




TEXT LINKS

Anycast DNS Hosting
MOST RECENT ISSUES

 Volume 19 (2019)
 
     »   Issue 2 / 2019
 
     »   Issue 1 / 2019
 
 
 Volume 18 (2018)
 
     »   Issue 4 / 2018
 
     »   Issue 3 / 2018
 
     »   Issue 2 / 2018
 
     »   Issue 1 / 2018
 
 
 Volume 17 (2017)
 
     »   Issue 4 / 2017
 
     »   Issue 3 / 2017
 
     »   Issue 2 / 2017
 
     »   Issue 1 / 2017
 
 
 Volume 16 (2016)
 
     »   Issue 4 / 2016
 
     »   Issue 3 / 2016
 
     »   Issue 2 / 2016
 
     »   Issue 1 / 2016
 
 
  View all issues  








LATEST NEWS

2019-Jun-20
Clarivate Analytics published the InCites Journal Citations Report for 2018. The JCR Impact Factor of Advances in Electrical and Computer Engineering is 0.650, and the JCR 5-Year Impact Factor is 0.639.

2018-May-31
Starting today, the minimum number a pages for a paper is 8, so all submitted papers should have 8, 10 or 12 pages. No exceptions will be accepted.

2018-Jun-27
Clarivate Analytics published the InCites Journal Citations Report for 2017. The JCR Impact Factor of Advances in Electrical and Computer Engineering is 0.699, and the JCR 5-Year Impact Factor is 0.674.

2017-Jun-14
Thomson Reuters published the Journal Citations Report for 2016. The JCR Impact Factor of Advances in Electrical and Computer Engineering is 0.595, and the JCR 5-Year Impact Factor is 0.661.

Read More »


    
 

  2/2019 - 5

Immunity Characterization of FPGA I/Os for Fault-Tolerant Circuit Designs against EMI

NGUYEN, V. T. See more information about NGUYEN, V. T. on SCOPUS See more information about NGUYEN, V. T. on IEEExplore See more information about NGUYEN, V. T. on Web of Science, DAM, M. T. See more information about  DAM, M. T. on SCOPUS See more information about  DAM, M. T. on SCOPUS See more information about DAM, M. T. on Web of Science, SO, J., LEE, J.-G. See more information about LEE, J.-G. on SCOPUS See more information about LEE, J.-G. on SCOPUS See more information about LEE, J.-G. on Web of Science
 
Click to see author's profile in See more information about the author on SCOPUS SCOPUS, See more information about the author on IEEE Xplore IEEE Xplore, See more information about the author on Web of Science Web of Science

Download PDF pdficon (1,484 KB) | Citation | Downloads: 95 | Views: 154

Author keywords
immunity, susceptibility, integrated circuit, electromagnetic compatibility, electromagnetic interference

References keywords
circuits(10), integrated(9), power(8), immunity(7), electromagnetic(7), temc(6), susceptibility(6), electro(6), compat(6), modeling(4)
Blue keywords are present in both the references section and the paper title.

About this article
Date of Publication: 2019-05-31
Volume 19, Issue 2, Year 2019, On page(s): 37 - 44
ISSN: 1582-7445, e-ISSN: 1844-7600
Digital Object Identifier: 10.4316/AECE.2019.02005
Web of Science Accession Number: 000475806300005
SCOPUS ID: 85066298408

Abstract
Quick view
Full text preview
This paper characterizes the immunity of I/Os under different supply voltages for fault-tolerant circuit designs against electromagnetic interference. The direct power injection approach is used as a means to characterize the immunity of circuits. In this work, the immunity characterization has been performed under two scenarios: (1) an input buffer of a Field Programmable Gate Array (FPGA) followed by a single flip-flop, and (2) the FPGA input buffer followed by a redundancy-based fault-tolerant circuit. The experimental results show that when downscaling the supply voltage through a set of nominal values (i.e., 3.3, 2.5, 1.8, 1.5, 1.2 V), the immunity of I/Os is decreased from the highest level at 3.3 V to the lowest at 1.2 V. Particularly, the maximum difference in the immunity is about 16.8 dB at the frequency of 600 MHz. Moreover, experiments demonstrate that I/O buffers followed by the redundancy-based fault-tolerant circuit can improve the immunity of the circuit up to 4 dB below the frequency band of 400 MHz. Thus, the redundancy-based fault-tolerant circuit can support I/Os to operate reliably in the harsh environment.


References | Cited By  «-- Click to see who has cited this paper

[1] Fr. Fiori, "Susceptibility of smart power ICs to radio frequency interference," IEEE Trans. Power Electron., vol. 29, no. 6, pp. 2787-2797, Jun. 2014.
[CrossRef] [Web of Science Times Cited 5] [SCOPUS Times Cited 5]


[2] A. Alaeldine, R. Perdriau, M. Ramdani, J.-L. Levant, and M. Drissi, "A Direct power injection model for immunity prediction in integrated circuits," IEEE Trans. Electromagn. Compat., vol. 50, no. 1, pp. 52-62, Feb. 2008.
[CrossRef] [Web of Science Times Cited 39] [SCOPUS Times Cited 54]


[3] T. Su, M. Unger, Th. Steinecke, and R. Weigel, "Using error-source switching (ESS) concept to analyze the conducted radio frequency electromagnetic immunity of microcontrollers," IEEE Trans. Electromagn. Compat., Vol. 54, No. 3, pp. 634-645, Jun. 2012.
[CrossRef] [Web of Science Times Cited 7] [SCOPUS Times Cited 10]


[4] M. Ramdani et al., "The Electromagnetic compatibility of integrated circuits—Past, Present, and Future," IEEE Trans. Electromagn. Compat., vol. 51, no. 1, pp. 78-100, 2009.
[CrossRef] [Web of Science Times Cited 138] [SCOPUS Times Cited 189]


[5] J. Wu et al., "Modeling and simulation of LDO voltage regulator susceptibility to conducted EMI," IEEE Trans. Electromagn. Compat., vol. 56, no. 3, pp. 726-735, Jun. 2014.
[CrossRef] [Web of Science Times Cited 14] [SCOPUS Times Cited 19]


[6] A. Ayed, Tr. Dubois, J.-L. Levant, and G. Duchamp, "A New method for the characterization of electronic components immunity," IEEE Trans. Instrum. Meas., vol. 64, no. 9, pp. 2496-2503, Sept. 2015.
[CrossRef] [Web of Science Times Cited 3] [SCOPUS Times Cited 4]


[7] M. Fontana, F. Canavero, and R. Perraud, "Integrated circuit modeling for noise susceptibility prediction in communication networks," IEEE Trans. Electromagn. Compat., vol. 57, no. 3, pp. 339-348, 2015.
[CrossRef] [Web of Science Times Cited 5] [SCOPUS Times Cited 5]


[8] R. Henderson, D. McMasters, D. French, and T. Clarke, "Direct power injection of microcontrollers in PCB environments," in Proc. of 2012 International Conference on Electromagnetics in Advanced Applications, Cape Town, 2012, pp. 1149-1151.
[CrossRef] [SCOPUS Times Cited 1]


[9] Ph. Schroter, Fr. Klotz, and M. Pamato, "RF immunity investigations of linear DC current regulators," in Proc. of the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, Edinburgh, 2015, pp. 119-124.
[CrossRef] [SCOPUS Times Cited 1]


[10] Zh. Wang, Ch. Zhou, T. Liu, Sh. Zhao, and Zh. Liang, "Nonlinear behavior immunity modeling of an LDO voltage regulator under conducted EMI," IEEE Trans. Electromagn. Compat., vol. 58, no. 4, pp. 1016-1024, Aug. 2016.
[CrossRef] [Web of Science Times Cited 1] [SCOPUS Times Cited 1]


[11] A. Lavarda, D. Amschl, S. Bauer, B. Deutschmann, "Characterization of the immunity of integrated circuits (ICs) at wafer level," in Proc. the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, Edinburgh, 2015, pp. 196-201.
[CrossRef] [SCOPUS Times Cited 2]


[12] T. Sawada, K. Yoshikawa, H. Takata, K. Nii, and M. Nagata, "An extended direct power injection method for in-place susceptibility characterization of VLSI circuits against electromagnetic interference," IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 23, no. 10, pp. 2347-2351, Oct. 2015.
[CrossRef] [Web of Science Times Cited 2] [SCOPUS Times Cited 4]


[13] K. Taniguchi et al., "Susceptibility evaluation of CAN transceiver circuits with in-place waveform capturing under RF DPI," in Proc. 11th International workshop on the Electromagnetic Compatibility of Integrated Circuits, 2017, pp. 59-63.
[CrossRef] [SCOPUS Times Cited 2]


[14] S. Dhia, A. Boyer, B. Vrignon, M. Deobarro, and T. V. Dinh, "On-Chip noise sensor for integrated circuit susceptibility investigations," IEEE Trans. Instrum. Meas., vol. 61, no. 3, pp. 696-707, 2012.
[CrossRef] [Web of Science Times Cited 18] [SCOPUS Times Cited 28]


[15] IEC 62132-4, Integrated circuits - measurement of electromagnetic immunity, 150 KHz to 1 GHz - part 4: direct RF power injection method, February, 2006. https://webstore.iec.ch/publication/6510

[16] L. Atias, A. Teman, and A. Fish, "Single event upset mitigation in low power SRAM design," in Proc. IEEE 28th Convention of Electrical and Electronics Engineers in Israel, Eilat, 2014, pp. 1-5.
[CrossRef] [SCOPUS Times Cited 4]


[17] David G. Mavis and Paul H. Eaton, "SEU and SET modeling and mitigation in deep submicron technologies," 45th Annual International Reliability Physics Symposium, Phoenix, 2007, pp. 293-305.
[CrossRef] [Web of Science Times Cited 46] [SCOPUS Times Cited 82]


[18] S. Kumar, S. Chellappa, and L. T. Clark, "Temporal pulse-clocked multi-bit flip-flop mitigating SET and SEU," in Proc. IEEE International Symposium on Circuits and Systems (ISCAS), Lisbon, 2015, pp. 814-817.
[CrossRef] [SCOPUS Times Cited 6]


[19] MACOM Division of AMP Inc., RF directional couplers and 3 dB hybrids, Application Note M560, Ver.2.00.

[20] Agilent, 8648C Synthesized RF Signal Generator, 9 kHz to 3200 MHz.

[21] Ophirrf, Linear Power RF Amplifier, model 5124.

[22] Xilinx Inc., Spartan-3 FPGA Family Datasheet, June, 2013, pp. 63-65.



References Weight

Web of Science® Citations for all references: 278 TCR
SCOPUS® Citations for all references: 417 TCR

Web of Science® Average Citations per reference: 12 ACR
SCOPUS® Average Citations per reference: 18 ACR

TCR = Total Citations for References / ACR = Average Citations per Reference

We introduced in 2010 - for the first time in scientific publishing, the term "References Weight", as a quantitative indication of the quality ... Read more

Citations for references updated on 2019-08-19 08:45 in 120 seconds.




Note1: Web of Science® is a registered trademark of Clarivate Analytics.
Note2: SCOPUS® is a registered trademark of Elsevier B.V.
Disclaimer: All queries to the respective databases were made by using the DOI record of every reference (where available). Due to technical problems beyond our control, the information is not always accurate. Please use the CrossRef link to visit the respective publisher site.

Copyright ©2001-2019
Faculty of Electrical Engineering and Computer Science
Stefan cel Mare University of Suceava, Romania


All rights reserved: Advances in Electrical and Computer Engineering is a registered trademark of the Stefan cel Mare University of Suceava. No part of this publication may be reproduced, stored in a retrieval system, photocopied, recorded or archived, without the written permission from the Editor. When authors submit their papers for publication, they agree that the copyright for their article be transferred to the Faculty of Electrical Engineering and Computer Science, Stefan cel Mare University of Suceava, Romania, if and only if the articles are accepted for publication. The copyright covers the exclusive rights to reproduce and distribute the article, including reprints and translations.

Permission for other use: The copyright owner's consent does not extend to copying for general distribution, for promotion, for creating new works, or for resale. Specific written permission must be obtained from the Editor for such copying. Direct linking to files hosted on this website is strictly prohibited.

Disclaimer: Whilst every effort is made by the publishers and editorial board to see that no inaccurate or misleading data, opinions or statements appear in this journal, they wish to make it clear that all information and opinions formulated in the articles, as well as linguistic accuracy, are the sole responsibility of the author.




Website loading speed and performance optimization powered by: